Figure 7From: Broadband antireflective silicon nanostructures produced by spin-coated Ag nanoparticlesIncident angle-dependent average reflectance and photographs of bulk Si and Si nanostructures. (a) Average reflectance as a function of incident angle for s- and p-polarized light and (b) photographs of bulk Si (left) and Si nanostructures (right) fabricated using the optimum fabrication conditions.Back to article page