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Figure 2 | Nanoscale Research Letters

Figure 2

From: Statistical characteristics of reset switching in Cu/HfO2/Pt resistive switching memory

Figure 2

Scatter plots of V reset and I reset and dependence of the calculated R TH on R on . The dependence of the Vreset(a) and Ireset(b) as a function of Ron. Vreset increases and Ireset decreases with Ron, respectively, which are well fitted by the thermal dissolution model (blue lines) with Treset = 400 K, RTH, = 2.3 × 105 K/W. (c) The dependence of calculated thermal resistance on the CF resistance. RTH, is considered as being constant with a value of 2.3 × 105 K/W.

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