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Figure 3 | Nanoscale Research Letters

Figure 3

From: Statistical characteristics of reset switching in Cu/HfO2/Pt resistive switching memory

Figure 3

Experimental distributions of V reset as a function of R on . (a) Experimental distributions of Vreset in different Ron ranges in Weibull plot. (b) Distributions of Vreset with fitting lines in three resistance ranges. The fitting lines show that the experimental distributions are roughly compatible with Weibull distributions. (c) The Gumbel distribution of Vreset in the same three resistance ranges as in (b). A small part of data fall into the circles, indicating that a small proportion of data belong to the tailing region of the distributions in (b). (d) The dependence of the Weibull slope and scale factor of Vreset distribution on Ron. The Weibull slope remains constant and the scale factor increases linearly with Ron.

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