Skip to main content
Figure 4 | Nanoscale Research Letters

Figure 4

From: Statistical characteristics of reset switching in Cu/HfO2/Pt resistive switching memory

Figure 4

Experimental distributions of I reset as a function of R on . (a) Experimental distributions of Ireset in different Ron ranges in Weibull plot. (b) Distributions of Ireset with fitting lines in three Ron ranges. The fitting lines show that the experimental distributions are roughly compatible with Weibull distributions. (c) The Gumbel distribution of Ireset in the three Ron ranges same as those in (b). A small part of data fall into the circles, indicating that a small proportion of data belong to the tailing region of the distributions in (b). (d) The dependence of the Weibull slope and scale factor of Ireset distributions on Ron. The Weibull slope stays constant, and the scale factor decreases linearly with Ron.

Back to article page