HRXRD results for the SrRuO
(111) substrate. (a) XRD θ to 2θ scan patterns. The left inset shows the rocking curve of the SrRuO3 (222) peak. FWHM was as small as 0.052°. The right inset shows good oscillations at low angles due to the uniform thickness of about 38 nm. (b) X-ray reciprocal space mapping around the STO (312) plane showed well-developed peaks for SrRuO3 in the lower region and two strong substrate peaks in the upper region.