Figure 4

Simulated reflectance spectrum and |E| ² cross-sectional distribution of Si inverted nanocone arrays. (a) The simulated reflectance spectrum of the Si inverted nanocone arrays with different 500 and 1,000 nm pitches. Simulated |E|² cross-sectional distribution of Si inverted nanocone arrays: (b1 and b2) 500 pitch at 806.723 and 564.706 nm wavelength, respectively; (c1 and c2) 1,000 pitch at 1,200 and 1,043 nm wavelength, respectively.