Figure 1
From: Effect of grain size on thermal transport in post-annealed antimony telluride thin films
Surfaces and cross-planes of the films annealed at 200°C, 250°C, 300°C, 320°C, and 350°C. (a-e) SEM surface images (top-view images) of the Sb2Te3 thin film of 400-nm thickness with post-annealing temperatures of 200°C, 250°C, 300°C, 320°C, and 350°C, respectively. The insets in each figure show cross-sectional images (tilted-view images) of the films annealed at temperatures of 200°C to 350°C. (f) EDX spectra of Sb2Te3 thin film at room temperature.