Figure 2From: Effect of grain size on thermal transport in post-annealed antimony telluride thin films XRD pattern, (1010) peak, and grain sizes and strains of Sb 2 T 3 thin films. (a) XRD pattern and (b) (1010) peak of Sb2T3 thin films with increasing annealing temperatures of up to 350°C. (c) and (d) Grain sizes and strains of Sb2Te3 thin films as a function of post-annealing temperatures of up to 350°C, respectively.Back to article page