Table 1 Calculated average grain sizes and atomic compositions of Sb2Te3 thin films at different annealing temperatures
From: Effect of grain size on thermal transport in post-annealed antimony telluride thin films
Annealing temperature (°C) | FWHM B(°) | Bcos θ | Average grain size D (nm) | EDX (atom %) | |
---|---|---|---|---|---|
Sb | Te | ||||
200 | 0.283 | 0.00150 | 88 | 40.2 | 59.8 |
250 | 0.254 | 0.00135 | 98 | 40.2 | 59.8 |
300 | 0.246 | 0.00131 | 101 | 41.8 | 58.2 |
320 | 0.190 | 0.00104 | 127 | 41.8 | 58.2 |
350 | 0.193 | 0.00100 | 129 | 42.6 | 57.4 |