Figure 2From: Investigations of ripple pattern formation on Germanium surfaces using 100-keV Ar+ ions AFM micrographs of the irradiated at fluence 3 × 10 17 ions/cm 2 sample of Ge(100). At angles of incidence of (a) 0°, (b) 15°, (c) 30°, (d) 45°, (e) 60°, and (f) 75° (all images in 2 × 2 μm2 scan size).Back to article page