Figure 3From: High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate The calculated (002) 2θ/ω XDPs for GaN NWs affected by the micro-deformation ε III ( z ) . The deformation distribution profiles of ε III(z) used for XDP calculation were defined by Equation 3 and are shown in the inset.Back to article page