Table 2 MoS 2 composition ratio change based on XPS data
From: Influence of post-annealing on the off current of MoS2 field-effect transistors
Sample condition | Atom | Atomic % | Simplified ratio (let Mo be 1) |
|---|---|---|---|
Non-annealed | S | 63.14 | 1.712 |
Mo | 36.86 | 1 | |
400°C-annealed | S | 69.51 | 2.280 |
Mo | 30.49 | 1 |