Figure 2
From: Single-crystalline chromium silicide nanowires and their physical properties
TEM analysis of chromium silicide nanowires. (a) Low magnification, (b) high-resolution TEM images of CrSi2 nanowires grown at 700°C. The inset in (b) shows the corresponding fast Fourier transform (FFT) pattern with a zone axis of [1–10]. (c) Low magnification, (d) high-resolution TEM images of Cr5Si3 nanowires grown at 750°C. The inset in (d) shows the corresponding FFT pattern with a zone axis of [0–11].