Surface microreliefs of quasigrating and dendrite-type topologies. AFM images (a,
c) and section analysis (b,
d) of GaAs surfaces with microrelief of quasigrating (a,
b) and dendrite-like type (c,
d) investigated by AFM technique (Dimension 3000 system with NanoScope IIIA controller, Digital Instruments, Indianapolis, IN, USA) in the tapping mode with a Si3N4 tip.