Figure 8

Cross-sectional views of instantaneous defects in single-crystalline aluminum substrates at a moving distance of 2.5 nm. Crystallographic orientation: (a) (010) and (b) (111).
Cross-sectional views of instantaneous defects in single-crystalline aluminum substrates at a moving distance of 2.5 nm. Crystallographic orientation: (a) (010) and (b) (111).