Figure 1From: Room-temperature electrically pumped near-infrared random lasing from high-quality m-plane ZnO-based metal-insulator-semiconductor devices XRD scans of the ZnO thin films grown on m-plane sapphire. (a) XRD spectra of the ZnO thin films grown on m-plane sapphire substrates. (b) XRD φ scans of sapphire (10–12) and ZnO (10–13).Back to article page