Figure 2

3D computer-generated patterns and AFM image of a real structure. Showing the morphology of island films ((a) 0.15 fill ratio, (b) 0.55 fill ratio); real morphology of the nanostructured silver film (height increases from darker to brighter, the brightest points correspond to approximately 15 nm) as seen by AFM (c); simulated film roughness (mean square deviation of film height at each simulated point from the average film thickness) as a function of fill ratio (d).