Fig. 2From: Formation of Nanocomposites by Oxidizing Annealing of SiO x and SiO x <Er,F> Films: Ellipsometry and FTIR AnalysisThe contribution of the sub-bands corresponding to different structural complexes into the main Si–O absorption band for the as-deposited and air-annealed SiO x and SiO x < Er,F > filmsBack to article page