Fig. 6From: Novel 14-nm Scallop-Shaped FinFETs (S-FinFETs) on Bulk-Si SubstrateVariability of V TH,lin and I on for fabricated 50 nm S-FinFETs and normal FinFETs. The measured variability of V TH,lin between a S-FinFETs and b normal FinFETs. The measured variability of I on between c S-FinFETs and d normal FinFETsBack to article page