Fig. 2
From: Light Trapping Enhancement in a Thin Film with 2D Conformal Periodic Hexagonal Arrays
SEM and AFM characterization results. The top-view SEM images of the conformal hexagonal structures with different periodicities: 300 nm (a), 600 nm (b), and 2 μm (c). The corresponding cross-sectional SEM image of the same configurations (d–f). All the scale bars are 500 nm. The tapping-mode SPM images of the surface topography of the conformal a-Si film with periodicities: 300 nm (g), 600 nm (h), and 2 μm (i)