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Fig. 1 | Nanoscale Research Letters

Fig. 1

From: Tunneling in Systems of Coupled Dopant-Atoms in Silicon Nano-devices

Fig. 1

Kelvin probe force microscopy of donor atoms. a KPFM measurement setup, showing a cantilever approached near the surface of a SOI-FET channel with the device under regular operation conditions. b A possible potential landscape induced by several isolated, ionized P-donors. c A possible potential landscape induced by a larger number of P-donors forming multiple-donor “clusters” (containing several donors located at distances smaller than 2 × r B from each other)

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