Fig. 6From: Facile Preparation of a Platinum Silicide Nanoparticle-Modified Tip Apex for Scanning Kelvin Probe MicroscopyThe EFM images of Si-based Au nanoislands acquired by using a PSM-60 tip for various applied biases on the substrate. The applied bias was 0 V for b, −0.5 V for d, −1.0 V for f, and −1.5 V for h. a, c, e, g The corresponding topographies acquired by applying AFM to b, d, f, and h, respectivelyBack to article page