Fig. 6

TEM images and EDS analysis of the 10- and 20-nm Au-catalyzed GaAs NWs. a–c Bright field TEM (BRTEM), high-resolution TEM (HRTEM), and selected area electron diffraction SAED) for 10-nm Au NP-induced NWs whereas (d–f) are BRTEM, HRTEM, and SAED for 20-nm Au-induced NWs. g EDS analysis obtained at the Au NPs and GaAs NW neck region for two sizes of samples and are marked with the corresponding regions in (b) and (e)