Fig. 3From: In Situ SR-XPS Observation of Ni-Assisted Low-Temperature Formation of Epitaxial Graphene on 3C-SiC/SiNi 2p3/2 core-level spectrum of SR-XPS. a Surface-sensitive SR-XPS spectrum obtained at the detection angle of 60° with respect to the surface normal. Inset is the relative peak intensity of Ni silicides (Ni2Si and NiSi) normalized by that of Ni. b A model for the stacking order between Ni and Ni silicide layersBack to article page