Fig. 3From: Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of IlluminationTopography image associated respectively to surface potential (KPFM) and current (CPAFM) measurements, a and b, respectively. Surface potential and current images without LED, c and d, respectively and at full LED illumination, e and f, respectively. The scan area is 2.5 × 5 μm for all the imagesBack to article page