Fig. 4From: Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of IlluminationPhotovoltage (a) and photocurrent (b) profiles measured at the sample cross section without LED illumination (dark) and under two intensities of illumination leading to V oc = 340 mV and V oc = 460 mV. Topography profiles associated to KPFM and CP-AFM (c)Back to article page