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Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Compensating the Degradation of Near-Infrared Absorption of Black Silicon Caused by Thermal Annealing

Fig. 3

Top-view SEM images at a 45° angle of black Si with and without Ag films(a)Black Si (b)Black Si with 20nm Ag film dep. (b-1)Top position of black Si with 20nm Ag film dep. (b-2) Bottom position of black Si with 20nm Ag film dep. (c)Black Si with 40nm Ag film dep. (c-1)Top position of black Si with 40nm Ag film dep. (c-2)Bottom position of black Si with 40nm Ag film dep

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