Fig. 3
From: X-ray Reciprocal Space Mapping of Graded Al x Ga1 − x N Films and Nanowires
The \( {\varepsilon}_{\left|\right|}^S(t) \) (red solid curve) and \( {\varepsilon}_{\left|\right|}^{\mathrm{total}}(t) \) (blue solid curve) profiles of graded Al x Ga1 − x N NWs on a Si(111) and b GaN(0001) substrates with the brown solid curves indicating the \( {\varepsilon}_{\left|\right|}^{\mathrm{free}}(t) \) profile. The Al composition profile along the NW length is the same as shown in Fig. 1a for the planar film