Fig. 14From: Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger MicroscopyGe Auger electron map of the small angle cross section surface. Auger electron map of Ge distribution on the surface of small angle cross section of the layer containing GeSi QDs on B 1 specimen. The rings enriched with Ge (warmer color area) are marked with dotted red circlesBack to article page