Fig. 2From: Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger MicroscopySEM image and the Auger electron maps of the A 1 specimen surface. SEM image of the analyzed surface area of the specimen А 1 (а) and the Auger electron maps corresponding to this area for Ge (b) and Si (c) distributions, respectivelyBack to article page