Fig. 3
From: Characteristics and Mechanism of Cu Films Fabricated at Room Temperature by Aerosol Deposition
Thickness of Cu films grown on Al2O3 substrates as a function of the scanning number. The inset shows the correlation between t n(ΔT/ΔS n ) and the scanning number, where ΔT is the variation of the film’s thickness, ΔS n is the variation of the scanning number, and n is the scanning number