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Fig. 2 | Nanoscale Research Letters

Fig. 2

From: Electrical and Optical Properties of CeNi5 Nanoscale Films

Fig. 2

Schematic representation absolute reflectivity measurement setup. 1 He-Ne laser source, 2 laser source power supply unit, 3 λ/4 crystalline quartz plaquette, 4 glass slide with a reflectivity of 0.04 at the selected laser wavelength, 5 laser radiation power meter, 6 the deposited film fixed on the goniometer, 7 Si photodiode, 8 digital voltmeter, 9 Glan-Thompson polarizer

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