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Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Analysis on the Filament Structure Evolution in Reset Transition of Cu/HfO2/Pt RRAM Device

Fig. 3

The distributions of V reset (a) and I reset (b) of Cu/HfO2/Pt RRAM device in different R on groups. The straight lines are those of fitting to the standard Weibull distribution. c The dependence of Weibull slope (β V ) and scale factor (V reset63%) of V reset distributions on 1/R on. β V the Weibull slope and 1/R on have a linear relation while V reset63% the scale factor keeps constant. d The dependence of Weibull slope (β I ) and scale factor (I reset63%) of I reset distributions on 1/R on. Both β I and I reset63% are in linear to 1/R on

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