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Fig. 5 | Nanoscale Research Letters

Fig. 5

From: Analysis on the Filament Structure Evolution in Reset Transition of Cu/HfO2/Pt RRAM Device

Fig. 5

The MC-simulated Weibull distributions of V reset (a) and I reset (b) in different n groups. The straight lines are fitting lines. c The dependence of the MC-simulated β V and V reset63% on n. β V the Weibull slope and n have a linear relation while V reset63% the scale factor keeps constant. d The dependence of the MC-simulated β I and I reset63% Weibull slope and scale factor as a function of n. Both of them increase with n linearly

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