Fig. 10From: On the Crystal Structural Control of Sputtered TiO2 Thin FilmsMagnitude of the Fourier-transformed EXAFS (k3χ) spectra of a Sn-doped TiO2 film with a Sn content of 37.6 at.% and the reference samples. The FTs were processed with a k-range of 2.5–10 Å − 1 for Sn K-edge EXAFS spectraBack to article page