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Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Optimizing Silicon Oxide Embedded Silicon Nanocrystal Inter-particle Distances

Fig. 3

TEM image of a multilayer sample and its nanocrystal diameter histogram. a Cross-sectional high-resolution TEM image of an annealed multilayer sample with silicon-rich and buffer layer thicknesses of 3 and 1 nm, respectively. b The histogram of the sample’s nanocrystal diameters. Approximately 250 nanocrystals were measured. The histogram is fitted with a log-normal probability density function with μ= 0.83 nm and σ= 0.27 nm

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