Fig. 6From: Effect of Grazing Angle Cross-Ion Irradiation on Ag Thin FilmsTRIM simulation plots for sputtering yield for the different density of Ag film: a bulk density, b an arbitrary low density value. c Energy relaxation of Ar ions in Ag thin films/Si substrate (in 100 nm × 100 nm y-z plane), after bombardment of 5000 Ar ions (in x-axis)Back to article page