Fig. 2From: Structural and Magnetoresistive Properties of Nanometric Films Based on Iron and Chromium Oxides on the Si SubstrateX-ray reflectivity curves of Fe2O3 − X (sample #1) film and Fe2O3 − Y /Cr3 − X O3 − Y multilayer (sample #4) deposited on Si substrate. Green lines show simulationsBack to article page