Table 1 Some parameters of typical samples investigated, T = 296 K
Sample composition | R 0, kOhm | Thickness obtained by | Roughness, nm | ||||
|---|---|---|---|---|---|---|---|
(Si - film) | (film - air) | R a, (AFM) | |||||
Profilometer, (nm) | XRR (nm) | ||||||
#1 | Fe2O3 − X , (0 ≤ x ≤ 1) | 47.0 | 80 ± 4 | 73 ± 1 | 1.4 | 0.9 | 0.939 |
#2 | Cr3 − X O3 − Y , (0 ≤ x ≤ 2; 0 ≤ y ≤ 2) | 512.0 | 55 ± 2.75 | – | – | – | 1.092 |
#3 | Fe2O3 − Y /Cr3 − X O3 − Y /Fe2O3 − Y /Cr3 − X O3 − Y | 22.0 | 50 ± 2.5 | – | – | – | – |
#4 | Fe2O3 − Y /Cr3 − X O3 − Y /Fe2O3 − Y /Cr3 − X O3 − Y | 7.0 | 10 | 10.8 ± 0.5 | 1.4 | 1.2 | – |