Fig. 2From: Analytical Description of Degradation-Relaxation Transformations in Nanoinhomogeneous Spinel CeramicsDegradation testing of RRD ΔR/R 0 caused by prolonged storage at 170 °C in Cu0.1Ni0.1Co1.6Mn1.2O4 thick films prepared with screen-printed Ag contacts (the symbols stand for experimental data and the line represents CER model curve) [15, 16]Back to article page