Fig. 1From: Atom Diffusion and Evaporation of Free-Ended Amorphous SiOx Nanowires: Nanocurvature Effect and Beam-Induced Athermal Activation EffectSequences of in situ TEM micrographs showing the typical structural evolution of the free-ended amorphous SiOx nanowires during uniform irradiation of e-beam with different current densities respectively at a 1 A/cm2 and b 10 A/cm2 Back to article page