Fig. 1From: Self-Assembled Formation of Well-Aligned Cu-Te Nano-Rods on Heavily Cu-Doped ZnTe Thin FilmsRHEED patterns of sample grown using TCu = 880 °C when e-beam aligned with a \( \left[1\overline{1}0\right] \) and b [110] direction. c Apparent resistivity as a function of Cu cell temperature. d–f AFM images of three samples grown under Cu cell temperature at 870, 940, and 1030 °CBack to article page