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Fig. 2 | Nanoscale Research Letters

Fig. 2

From: Radiation Induced Enhancement of Hydrogen Influence on Luminescent Properties of nc-Si/SiO2 Structures

Fig. 2

Deconvolution of PL spectra into Gaussian profiles for initial (a), thermally treated in hydrogen (b), γ-irradiated with the dose 2 × 107 rad (c), and γ-irradiated and thermally treated in hydrogen nc-Si/SiO2 structures (d). PL spectra were measured at the maximum excitation intensity (1019 quanta cm−2 s−1). In the inserts, the excitation power dependences of the area of corresponding Gaussians are displayed

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