Fig. 7From: Silicon Nanostructures Produced by Modified MacEtch Method for Antireflective Si SurfaceReflectance as a function of wavelength: 1, clean Si wafer; 2, Si wafer with SiNPs produced by Au-MacEtch; 3, Si wafer with SiNWs produced by Ag-MacEtch; 4, Si wafer with SiNWs produced by Au-MacEtchBack to article page