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Nanoscale Research Letters
Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Enhanced Dielectric Environment Sensitivity of Surface Plasmon-Polariton in the Surface-Barrier Heterostructures Based on Corrugated Thin Metal Films with Quasi-Anticorrelated Interfaces

Fig. 3

Spectra of p-polarized light transmittance at normal incidence for multilayer structure depending on the environment refractive index for heterostructures with quasi-anticorrelated (trapezoidal cross-sectional shape of ChP wire with a trapeze ratio of 0.2) and correlated interfaces of metal film (sinusoidal profile with a film thickness of 40 nm). Period 750 nm and grating depth 60 nm are the same for both structures

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