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Fig. 4 | Nanoscale Research Letters

Fig. 4

From: Enhanced Dielectric Environment Sensitivity of Surface Plasmon-Polariton in the Surface-Barrier Heterostructures Based on Corrugated Thin Metal Films with Quasi-Anticorrelated Interfaces

Fig. 4

Spectra of s- and p-polarized light transmittance at normal incidence for multilayer structure with quasi-anticorrelated interfaces of metal film for various shapes of chalcogenide wires cross-section (changing from triangular to rectangular shapes). Dashed line corresponds to the p-polarized transmittance for correlated interfaces of metal film with sinusoidal profiles. Dotted lines correspond to the s-polarized transmittance for multilayer structure with correlated and quasi-anticorrelated interfaces of metal film. Structure parameters are the same as in Fig. 3

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