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Fig. 5 | Nanoscale Research Letters

Fig. 5

From: Enhanced Dielectric Environment Sensitivity of Surface Plasmon-Polariton in the Surface-Barrier Heterostructures Based on Corrugated Thin Metal Films with Quasi-Anticorrelated Interfaces

Fig. 5

The dependence of polarization sensitivity (T p /T s ) and signal intensity sensitivity on the wavelength (∂ T/∂ λ) for multilayer structures with quasi-anticorrelated metal film interfaces as a function of the cross-sectional shape of ChP wires (changing from triangular to rectangular shape). The horizontal line indicates the reference value for the equivalent structure with correlated metal film interfaces with sinusoidal profiles. Structure parameters are the same as in Fig. 3

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