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Fig. 7 | Nanoscale Research Letters

Fig. 7

From: Enhanced Dielectric Environment Sensitivity of Surface Plasmon-Polariton in the Surface-Barrier Heterostructures Based on Corrugated Thin Metal Films with Quasi-Anticorrelated Interfaces

Fig. 7

Spectral dependence of the photocurrent measured for p- and s-polarized light at normal incidence for two types of metal film correlation in surface-barrier heterosrtuctures based on Schottky barrier with geometrical parameters: a quasi-anticorrelated relief L=750 nm, h=50 nm, h Au 1=20 nm, and h Au 2=35 nm and b correlated (sinusoidal) relief L=760 nm, h=70 nm, and h Au =40 nm. The schematic cross section of structure with quasi-anticorrelated metal film interfaces is presented in Fig. 2

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