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Fig. 2 | Nanoscale Research Letters

Fig. 2

From: Paramagnetic Intrinsic Defects in Polycrystalline Large-Area 2D MoS2 Films Grown on SiO2 by Mo Sulfurization

Fig. 2

K-band ESR spectra observed at 1.8 K using P μ ~ 25 nW for B//n on three 2D MoS2/SiO2/(100)Si entities, showing the observation of the LM1 signal (at g ~ 2.0014 in the process-a samples). The signal at g = 1.99875 stems from a co-mounted Si:P marker sample, also used for field axis alignment of the spectra. The spectra have been normalized to equal Si:P marker intensity and sample area

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