Fig. 2
From: Direct Growth of Al2O3 on Black Phosphorus by Plasma-Enhanced Atomic Layer Deposition
a-f Optical images of accelerated BP degradation on SiO2/Si exposed to air for different time. g-i AFM images of BP flake exposed to the air ambient for 2, 3, and 4 h. All three BP samples for AFM measurements were taken from the same batch. The average thickness of BP in g–i was 130 nm. j The average RMS roughness of BP samples versus the exposure time, the same samples as shown in g–i